Blogs (1) >>
ICSE 2019
Sat 25 - Fri 31 May 2019 Montreal, QC, Canada
Thu 30 May 2019 11:00 - 11:30 at Laurier - Unit Testing Chair(s): Martin Kropp

It is a continuous struggle to understand how much a product should be tested before the delivery to the market. Ericsson decided to evaluate the adequacy of unit test coverage criterion that they employed for years as a guide for sufficiency of testing. Naturally one can think that if increasing coverage decreases the number of defects significantly, then that coverage measure can be considered a criterion for test sufficiency. To test this hypothesis in practice we investigated the relationship of unit test coverage measures and post-unit-test defects in a large commercial product of Ericsson. Based on the results we would like to indicate that the current unit test coverage measures do not seem to be any tangible help in producing defect-free software.

Thu 30 May

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11:00 - 12:30
Unit TestingTechnical Track / Software Engineering in Practice / Papers / Journal-First Papers at Laurier
Chair(s): Martin Kropp University of Applied Sciences Northwestern Switzerland
(SEIP Talk) Mythical Unit Test CoverageSEIPIndustry Program
Software Engineering in Practice
Vard Antinyan Volvo Car Group, Miroslaw Staron University of Gothenburg
Research paper
Hunting for Bugs in Code Coverage Tools via Randomized Differential TestingTechnical Track
Technical Track
Yibiao Yang Nanjing University, China, Yuming Zhou , Hao Sun Unaffiliated, Zhendong Su ETH Zurich, Zhiqiang Zuo Nanjing University, China, Lei Xu Nanjing University, Baowen Xu
Rotten Green TestsTechnical Track
Technical Track
Julien Delplanque University of Lille, Stéphane Ducasse INRIA Lille, Guillermo Polito Univ. Lille, CNRS, Centrale Lille, Inria, UMR 9189 - CRIStAL - Centre de Recherche en Informatique Signal et Automatique de Lille, Andrew P. Black Portland State University and INRIA, Anne Etien Ecole Polytechnique Universitaire de Lille
A comprehensive study of pseudo-tested methodsJournal-First
Journal-First Papers
Oscar Luis Vera Pérez INRIA, Benjamin Danglot University Lille 1 and INRIA, Martin Monperrus KTH Royal Institute of Technology, Benoit Baudry KTH Royal Institute of Technology, Sweden
Link to publication DOI Pre-print
Discussion Period