Guiding Deep Learning System Testing using Surprise AdequacyTechnical Track
Deep Learning (DL) systems are rapidly being adopted in safety and security critical domains, urgently calling for ways to test their correctness and robustness. Testing of DL systems has traditionally relied on manual collection and labelling of data. Recently, a number of coverage criteria based on neuron activation values have been proposed. These criteria essentially count the number of neurons whose activation during the execution of a DL system satisfied certain properties, such as being above predefined thresholds. However, existing coverage criteria are not sufficiently fine grained to capture subtle behaviours exhibited by DL systems. Moreover, evaluations have focused on showing correlation between adversarial examples and proposed criteria rather than evaluating and guiding their use for actual testing of DL systems. We propose a novel test adequacy criterion for testing of DL systems, called Surprise Adequacy for Deep Learning Systems (SADL), which is based on the behaviour of DL systems with respect to their training data. We measure the surprise of an input as the difference in DL system’s behaviour between the input and the training data (i.e., what was learnt during training), and subsequently develop this as an adequacy criterion: a good test input should be sufficiently but not overtly surprising compared to training data. Empirical evaluation using a range of DL systems from simple image classifiers to autonomous driving car platforms shows that systematic sampling of inputs based on their surprise can improve classification accuracy of DL systems against adversarial examples by up to 77.5% via retraining.
Fri 31 MayDisplayed time zone: Eastern Time (US & Canada) change
14:00 - 15:30 | Testing of AI SystemsNew Ideas and Emerging Results / Demonstrations / Technical Track at Place du Canada Chair(s): Marija Mikic Google | ||
14:00 20mTalk | CRADLE: Cross-Backend Validation to Detect and Localize Bugs in Deep Learning LibrariesTechnical Track Technical Track Hung Viet Pham University of Waterloo, Thibaud Lutellier , Weizhen Qi University of Science and Technology of China, Lin Tan Purdue University Pre-print | ||
14:20 20mTalk | Guiding Deep Learning System Testing using Surprise AdequacyTechnical Track Technical Track Jinhan Kim KAIST, Robert Feldt Chalmers University of Technology, Shin Yoo Korea Advanced Institute of Science and Technology Authorizer link Pre-print | ||
14:40 20mTalk | DeepConcolic: Testing and Debugging Deep Neural NetworksDemos Demonstrations Youcheng Sun University of Oxford, Xiaowei Huang University of Liverpool, Daniel Kroening University of Oxford, James Sharp Defence Science and Technology Laboratory (Dstl), Matthew Hill Defence Science and Technology Laboratory (Dstl), Rob Ashmore Defence Science and Technology Laboratory (Dstl) | ||
15:00 10mTalk | Towards Improved Testing For Deep LearningNIER New Ideas and Emerging Results Pre-print | ||
15:10 10mTalk | Structural Coverage Criteria for Neural Networks Could Be MisleadingNIER New Ideas and Emerging Results Zenan Li Nanjing University, Xiaoxing Ma Nanjing University, Chang Xu Nanjing University, Chun Cao Nanjing University Pre-print | ||
15:20 10mTalk | Robustness of Neural Networks: A Probabilistic and Practical PerspectiveNIER New Ideas and Emerging Results |